X-ray diffraction ( XRD)
MiniFlex Benchtop Powder X-ray Diffraction (XRD)
Qualitative and quantitative phase analysis of poly-crystalline materials
The MiniFlex benchtop X-ray diffractometer is a multipurpose powder diffraction analytical instrument that can determine: crystalline phase identification (phase ID) and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to the MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex XRD system decades ago.
SmartLab Automated Multipurpose X‑ray Diffractometer (XRD) With Guidance Software
Powder diffraction, thin film metrology, SAXS, in-plane scattering, operando measurements
Rigaku SmartLab is the newest and most novel high-resolution X-ray diffractometer (XRD) available today. Perhaps its most novel feature is the new SmartLab Studio II software, which provides the user with an intelligent User Guidance expert system functionality that guides the operator through the intricacies of each experiment. It is like having an expert standing by your side.
This new X-ray diffraction system features the PhotonMax high-flux 9 kW rotating anode X-ray source coupled with a HyPix-3000 high-energy-resolution 2D multidimensional semiconductor detector that supports 0D, 1D and 2D measurement modes, allowing all applications to be handled with a single detector, eliminating the inconvenience of preparing and switching individual detectors for different applications. The HyPix-3000 detector can be used to obtain 2D powder diffraction patterns, which can be processed to deliver superior qualitative analysis by using all the 2D pattern information. The system incorporates a high-resolution θ/θ closed loop goniometer drive system with an available in-plane diffraction arm. The system’s new Cross-Beam-Optics (CBO) family feature fully automated switchable reflection and transmission optics (CBO-Auto).
SmartLab SE Multipurpose X-ray Diffraction System with Built-In Intelligent Guidance
Powder diffraction, thin film diffraction, SAXS, pole figure, residual stress and non-ambient experiments
The SmartLab SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original SmartLab to receive the R&D 100 Award in 2006: automatic alignment, component recognition, cross beam optics and advanced photon counting hybrid pixel array detectors (HPAD).
SmartLab Studio II incorporates a built-in Guidance expert system that suggests the optimal hardware configuration and settings for specific application measurements. The software will determine which optics are most appropriate for a given application, determine the instrument settings and execute the measurement, delivering a completely automated measurement sequence. Since the SmartLab SE has built-in component recognition, Guidance will not only tell you how you should configure the SmartLab SE for a given measurement, it will also warn you if you have not configured it properly. Expert advice coupled with hardware that will confirm the correct configuration is the foundation of the SmartLab SE platform.
