X‑ray analysis

Advanced materials characterization and structural analysis are critical pillars of modern research, demanding uncompromising precision across diverse scientific disciplines. Rigaku’s comprehensive portfolio addresses these demands through advanced analytical solutions: compact benchtop and high-resolution floor-standing X-ray diffractometers (XRD), including the MiniFlex, SmartLab, and SmartLab SE systems for phase identification, crystal structure, stress, and thin-film microstructural analysis; high-performance single-crystal crystallography systems (XtaLab Synergy-R rotating anode and Synergy-S microfocus systems) integrated with high-flux X-ray sources and hybrid photon counting detectors for rapid 3D molecular structure determination; energy-dispersive and wavelength-dispersive X-ray fluorescence spectrometers (EDXRF/WDXRF, such as the ZSX Primus series) for precise non-destructive elemental analysis across solid, liquid, and powder samples; and high-resolution micro-CT systems (including CT Lab HX) providing non-destructive 3D volumetric inspection and internal structure analysis for advanced materials and biological samples.